Design of Applied Measurement Systems (MEP-382)

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Course Meeting Times:
Lectures: 2 sessions/week, 1.5 hours/session
Sections: 1 session / week, 1.5 hours/session
Laboratories: 1 session/2 weeks, 1.5 hour/session

Goals
After this course you will be able to:

• Identify elements associated with measurement systems (DC and AC circuits, operational amplifiers, computer programming and instrumentation).
  

• Build and use a set of basic instrumentation and computer based data acquisition systems to acquire data from a laboratory experiment, engineering field site or test vehicle and process it using standard algorithms.
• Use LabVIEW and data acquisition devices to construct examples of data acquisition and processing.
  

Related Courses
After this course, related courses include:
Electronics for instrumentation (ECE-496)
Mechatronics(2) (MDP-454)
Project (MDP-499)

Recommended Textbooks:
LabVIEW: Graphical Programing (4thEdition) by Gary W. Johnson
Instrumentation and Measurement by Northrop

Examinations:
There will be a mid-term exam scheduled after  Lecture 10. The final exam is 3 hours long.

Sections:
The purpose of the recitations is to give students experience in the subject by working out examples and expanding on the material presented in the lectures. Attendance and participation in the recitations is obligatory.

Homework:
Homework problems will typically be assigned every Section and will be due as specified in the assignments section. The problem sets will be provided in the assignments section. Late homework will be accepted but with maximum of half the grade given.
You may discuss the problems with others in class, but you must (a) write up your eventual solution independently, and (b) list the names of students with whom you discussed the problem set.

Grading:

• 5% - Attendance & Class Contributions
• 5% - Quizzes
• 5% - Labs
• 10% - Midterm Exam
• 10% - Project

• 70% - Final Exam

List of Topics:

• Lecture 1 –Introduction
• Lecture 2 –Critical Instrumentation Definitions
• Lecture 3 –Revision: DC & AC Circuit Basics
• Lecture 4 –Revision: Digital Logic, Computer, Signals and Systems Basics
• Lecture 5 –Signal Conditioning
• Lecture 6 –D/A & A/D Conversion
• Lecture 7 –Sensor Systems
• Lecture 8 –Errors and calibration
• Lecture 9 –Transduction mechanisms (1)
• Lecture 10 –Transduction mechanisms (2)
  
• Lecture 11 –LabVIEW and Data Acquisition
• Lecture 12 –Digital I/O and counters/timers
• Lecture 13 –Instrument and Communications Standards
• Lecture 14 –MEMS Introduction
• Lecture 15 –Microfabrication processes
• Lecture 16 –MEMS technologies
• Lecture 17 –MEMS-based sensors (1)
• Lecture 18 –MEMS-based sensors (2)